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Search: "[ keyword: Vision Test ]" (1)
The Fastest Path Search and Defect Inspection of Type (sLa-pRc)
Kim Soon Ho, Lee Eun Ser, Kim Chi Su KIPS Transactions on Software and Data Engineering,
Vol. 10, No. 10, pp. 385-390,
Oct.
2021
https://doi.org/10.3745/KTSDE.2021.10.10.385
Keywords: SMT, SMD, Gantry, Moving Time, Vision Test
https://doi.org/10.3745/KTSDE.2021.10.10.385
Keywords: SMT, SMD, Gantry, Moving Time, Vision Test
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